Scanning Electron Microscopy (SEM)

Author Topic: Scanning Electron Microscopy (SEM)  (Read 1142 times)

Offline Kishwar-E Hasin

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Scanning Electron Microscopy (SEM)
« on: April 20, 2017, 10:12:19 AM »
Today I am going to share with all of my DIU colleagues about a research characterization tool: SEM. With SEM, we can magnify a portion of a substance (experimental sample) to a significantly larger one (say, 1 lac times, or 50000 times from the original one).

In my M.Phil. research, I performed the SEM analyses of my samples under different magnifications. This is why, I know a bit about it.

SEM carries much importance in material as well as biological sciences. We can detect the impurity level as well as the size of inner particles with the help of SEM. The nano-devices also needed to have SEM analyses in order to be assured whether it has been fabricated in desired condition or not.

If any DIU family member want to know more about SEM, they are cordially welcome here to discuss here. Thank you.
Kishwar-E Hasin
Lecturer in Physics,
Department of General Educational Development,
Daffodil International University.